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The STIL SYSTEMS SERIES are made up of different models, each dedicated to one or several applications, in Industrial and Labs environment, 24/7.
Combined with the huge variety of STIL MARPOSS Point sensor heads, allow to offer excellent metrological performance off-line and in-line.
Flexibe, Easy-to-Use and respectfull of environmental constraints, STIL SYSTEMS are standard or Customized to correspond to Non Contact Measurement and Defects Inspection within madatory Cycle Time: from 4 seconds to measure Automotive Car Glass or complete smartphone.
STIL SYSTEMS solutions are used in multiple application contexts and on every kind of surface reflectivity as transparent or opaque, shiny or diffusing
优势 Part number | MIME-3M1R-115 | MIME-3M3R-115 | |
Model | MIME-3M1R-115 | MIME-3M3R-115 | |
X-Y Parameters | Travel | 100 | 100 |
Encoder | No | Yes | |
Position accuracy | 10µm/100mm | 1µm/100mm | |
Position resolution | 0,1µm | 0,1µm | |
Flatness | 1µm/100mm | 1µm/100mm | |
Max. speed | 20mm/s | 20mm/s | |
Z Parameters | Travel | 50 | 50 |
Encoder | Yes | Yes | |
Position accuracy | 1µm/100mm | 1µm/100mm | |
Position resolution | 0,1µm | 0,1µm | |
Flatness | 1µm/100mm | 1µm/100mm | |
Max. speed | 5mm/s | 5mm/s | |
Dimension (lxdxh) | 640x612x606 | 640x612x606 | |
Weight (kg) | 120 | 120 |
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